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but may find increased importance in the future
or SEMI M38 are specified by customers of silicon wafer suppliers and are usually part of Certificates of Compliance
according to current IEC standards
SEMI C102-0621 (first published)
G00800 - SEMI G8 - Test Method for Gold Plating StdVol-Equipment Automation Hardware but may find increased importanceNOTICE: This Standard or Safety Guideline has an Inactive Status because the conditions to maintain Current Status have not been met. Inactive Standards or Safety Guidelines are available from SEMI and continue to be valid for use. This Test Method describes procedures to determine gold plating quality. These methods apply to gold plating on cofired ceramic or metal packages. The grade, hardness, and thickness of the gold plating shall be specified
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